Benoit Baudry and Franck Fleurey, Yves Le Traon: Improving Test Suites for Efficient Fault Localization. from nettail.netさんのblogから。
Proceedings of ICSE 2006, pp.82-91, Shanghai, China, May 2006.

ICSE 2006のテスト関係の論文チェックしとかないとな。
ICSE 2006のリサーチトラックを見ると13のトラックのうち4つがテスト関係。ASEもそうだが、テストという分野は思いのほか流行のようだ。

  • Improving Test Suites for Efficient Fault Localization, Benoit Baudry, Franck Fleurey, IRISA, France; Yves Le Traon, France Telecom R&D, France
  • Automated, Contract-based User Testing of Commercial-Off-The-Shelf Components, Lionel Briand, Yuan Labiche, Mike Sowka, Carleton University, Canada
  • An Intensional Approach to the Specification of Test Cases for Database Systems, David Willmor, Suzanne Embury, Univ. of Manchester, UK
  • HDD: Hierarchical Delta Debugging, Ghassan Misherghi, Zhendong Su, University of California, Davis, USA
  • Managing Space for Finite-State Verification, Jianbin Tan, George Avrunin, Lori Clarke, Univ. of Massachusetts, Amherst, USA
  • Backwards-Compatible Array Bounds Checking for C with Very Low Overhead, Dinakar Dhurjati, Vikram Adve, University of Illinois at Urbana-Champaign, USA
  • Modular Checking for Buffer Overflows in the Large, Brian Hackett, Manuvir Das, Daniel Wang, Zhe Yang, Microsoft Corporation, USA
  • Discovering Faults in Idiom-Based Exception Handling, Magiel Bruntink, CWI, Arie van Deursen, CWI & TUD, Tom Tourwe, CWI & VUB, The Netherlands
  • Static Detection of Leaks in Polymorphic Containers, David Heine, Tensilica, Inc., USA; Monica Lam, Stanford University, USA
  • Osprey: A Practical Type System for Validating Dimensional Unit Correctness of C Programs, Lingxiao Jiang, Zhendong Su, University of California, Davis, USA
  • Locating Faults through Automated Predicate Switching, Xiangyu Zhang, Rajiv Gupta, Neelam Gupta, Univ. of Arizona, USA
  • Perracotta: Mining Temporal API Rules From Imperfect Traces, Jinlin Yang, David Evans, University of Virginia, USA; Deepali Bhardwaj, Thirumalesh Bhat, Manuvir Das, Microsoft Corporation, USA

そのほか ICSEのWorkshop
First International Workshop on Automation of Software Test (AST'06)
A Survey of Coverage Based Testing, by Qian Yang, J. Jenny Li and David Weiss, Avaya Labs Research, USA